Nota de aplicación
A form of very high resolution scanning probe microscopy in which a sample in solution is moved under an atomically sharp (i.e. only a few atoms wide) stylus mounted on a cantilevered spring. A detector senses deflections of the cantilever, measuring the force between stylus and surface, and transmits this information to an electronic display system.
Ubicación jerarquía
- Faceta Actividades
- .. procesos y técnicas
- .... <procesos y técnicas por tipo específico>
- ...... técnicas de análisis y prueba
- ........ microscopía
- .......... atomic force microscopy
- .......... microscopía electrónica [+]
- .......... microscopía de fluorescencia [+]
- .......... high temperature microscopy
- .......... infinite focus microscopy
- .......... infrared microscopy
- .......... laser microscopy
- .......... optical microscopy [+]
- .......... polarized light microscopy
- .......... thermomicroscopy
- .......... videomicroscopía