Nota de aplicación
Sensitive surface analytical technique that measures secondary electrons excited by an incident electron beam. This technique is used to determine elemental composition of the top few nanometers of solid, electrically conductive materials.
Ubicación jerarquía
- Faceta Actividades
- .. procesos y técnicas
- .... <procesos y técnicas por tipo específico>
- ...... técnicas de análisis y prueba
- ........ espectroscopia
- .......... emission spectroscopy
- ............ atomic emission spectroscopy [+]
- ............ Auger electron spectroscopy
- ............ electron energy loss spectroscopy
- ............ optical emission spectroscopy [+]