Nota de aplicación
A surface analysis technique which measures the elastically scattered ion created when a primary ion beam is directed at the sample surface. The kinetic energy of the reflected primary ion depends on the mass of the surface atom involved in scattering, thus revealing information about the sample surface.
Ubicación jerarquía
- Faceta Actividades
- .. procesos y técnicas
- .... <procesos y técnicas por tipo específico>
- ...... técnicas de análisis y prueba
- ........ espectrometría de masa
- .......... espectrometría de masas con aceleradores
- .......... evolved gas analysis
- .......... ion scattering spectroscopy
- .......... pyrolysis mass spectrometry [+]
- .......... secondary ion mass spectrometry
- .......... secondary neutral mass spectrometry
- .......... thermal ionization mass spectrometry
- .......... time-of-flight mass spectrometry